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Dou, Jingrui
1
results:
Bookchapter (Online) X
Search for persons
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?
1
Reliability-Aware Ultra-Scaled IDG-InGaZnO-FET Compact Mode..:
, In:
2023 International Electron Devices Meeting (IEDM)
,
Xu, Lihua
;
Chen, Kaifei
;
Li, Zhi
... - p. 1-4 , 2023
Link:
https://doi.org/10.1109/..
1-1
