Espitia-Pérez, Pedro
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3

Deep Learning-Based Partial Transfer Fault Diagnosis Method..:

, In: 2023 IEEE 28th International Conference on Emerging Technologies and Factory Automation (ETFA),
 
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Contributors:

, In: Andean Structural Styles,
Aizprua, Carlos ; Almeida, Rafael ; Arias, Jaime... - p. ix-xii , 2022
 
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5

Contributors:

, In: Antimicrobial Food Packaging,
Achi, S. ; Adley, C.C. ; Alessandro, M.... - p. xvii-xx , 2016
 
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