Search for persons
X
?
Proceedings of the 25th Pan-American Conference of Naval Engineering—COPINAVAL ,
1
Optimization of Iron and Steel Products for Shipping:
, In:
?
Proceedings of the 25th Pan-American Conference of Naval Engineering—COPINAVAL ,
2
Fire in Confined Spaces: A Pending Task of the Internationa..:
, In:
?
Proceedings of the Conference on Design, Automation and Test in Europe ,
3
Optimizing data-flow graphs with min/max, adding and relati..:
, In:
?
2010 Forum on Specification & Design Languages (FDL 2010) ,
4
Formal support for untimed SystemC specifications: Applicat..:
, In:
?
2023 22nd IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm) ,
5
Thermal Impedance and Dynamics of Phase Change Materials un..:
, In:
?
Companion of the 2024 ACM/IEEE International Conference on Human-Robot Interaction ,
6
Deploying a Robotic ride-on Car in the Hospital to Reduce t..:
, In:
?
2023 IEEE International Reliability Physics Symposium (IRPS) ,
8
Challenges and solutions to the defect-centric modeling and..:
, In:
?
2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) ,
9
A detailed, cell-by-cell look into the effects of aging on ..:
, In:
?
2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) ,
10
Design considerations for a CMOS 65-nm RTN-based PUF:
, In:
?
2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) ,
11
A Peak Detect & Hold circuit to measure and exploit RTN in ..:
, In:
?
2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) ,
12
Reliability evaluation of IC Ring Oscillator PUFs:
, In:
?
2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) ,
13
Strategies for parameter extraction of the time constant di..:
, In:
?
2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) ,
14
A Test Module for Aging Characterization of Digital Circuit:
, In:
?
2022 18th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) ,
15