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Fornasier, Matteo
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1

Deep Level Effects in N-Polar AlGaN/GaN High Electron Mobil..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Saro, Marco ; de Pieri, Francesco ; Carlotto, Andrea... - p. 5B.2-1-5B.2-8 , 2024
Link: https://doi.org/10.1109/..
 
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2

Thermally-activated failure mechanisms of 0.25 \ \mu \mathr..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Gao, Zhan ; Chiocchetta, Francesca ; Rampazzo, Fabiana... - p. 1-5 , 2023
Link: https://doi.org/10.1109/..
 
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