Fujita, Masato
11  results:
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1

A 1/1.57-inch 50Mpixel CMOS Image Sensor With 1.0μm All-Dir..:

, In: 2022 IEEE International Solid- State Circuits Conference (ISSCC),
Jung, Taesub ; Fujita, Masato ; Cho, Jeongjin... - p. 102-104 , 2022
 
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2

Traffic Jam Detection Using Real-Time Bus Operation Data Co..:

, In: 2024 18th International Conference on Ubiquitous Information Management and Communication (IMCOM),
 
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3

Effectiveness of Reward Functions for Deep Reinforcement Le..:

, In: 2023 15th International Congress on Advanced Applied Informatics Winter (IIAI-AAI-Winter),
Kijima, Masato ; Fujita, Katsuhide - p. 236-241 , 2023
 
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4

Childcare Emotion Recognition Support Solved by Machine Lea..:

, In: 2022 IEEE 4th Global Conference on Life Sciences and Technologies (LifeTech),
Hatano, Masaki ; Fuji, Shota ; Fujita, Hayato... - p. 489-491 , 2022
 
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5

Objection!: Identifying Misclassified Malicious Activities ..:

, In: ICC 2022 - IEEE International Conference on Communications,
Fujita, Koji ; Shibahara, Toshiki ; Chiba, Daiki.. - p. 2065-2070 , 2022
 
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6

Cesium Radioactivity in Marine and Freshwater Products and ..:

, In: Behavior of Radionuclides in the Environment III,
Wada, Toshihiro ; Nemoto, Yoshiharu ; Fujita, Tsuneo... - p. 313-351 , 2022
 
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7

Treatment of Class II open bite malocclusion supported by s..:

, In: Skeletal Anchorage in Orthodontic Treatment of Class II Malocclusion,
Tanne, Kazuo ; Ohtani, Junji ; Sunagawa, Hiroko.. - p. 235-238 , 2015
 
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8

Contributors:

, In: Skeletal Anchorage in Orthodontic Treatment of Class II Malocclusion,
 
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9

Identifying and verifying clock synchronization protocol pa..:

, In: Proceedings of the workshop on Internet of Things and Service Platforms,
Fujita, Sho ; Ooishi, Kenji ; Ishii, Yosuke. - p. 1-8 , 2011
 
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10

A Study on Quenching Characteristics of YBaCuO Bulk Superco..:

, In: Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts,
 
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11

Contact Resistance Characteristics of High Temperature Supe..:

, In: Electrical Contacts - 2006. Proceedings of the 52nd IEEE Holm Conference on Electrical Contacts,
 
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