Search for persons
X
?
2023 IEEE European Test Symposium (ETS) ,
4
Intra-cell Resistive-Open Defect Analysis on a Foundry 8T S..:
, In:
?
2023 IEEE International Test Conference (ITC) ,
5
Predictor BIST: An "All-in-One" Optical Test Solution for C..:
, In:
?
2023 IEEE European Test Symposium (ETS) ,
6
On Using Cell-Aware Methodology for SRAM Bit Cell Testing:
, In:
?
2022 IEEE European Test Symposium (ETS) ,
7
A Generic Fast and Low Cost BIST Solution for CMOS Image Se..:
, In:
?
2022 IEEE International Test Conference (ITC) ,
8
A Comprehensive Learning-Based Flow for Cell-Aware Model Ge..:
, In:
?
2020 IEEE European Test Symposium (ETS) ,
9
Design, Verification, Test and In-Field Implications of App..:
, In:
?
2020 IEEE International Test Conference (ITC) ,
10
A Learning-Based Cell-Aware Diagnosis Flow for Industrial C..:
, In:
?
2020 IEEE European Test Symposium (ETS) ,
11
Learning-Based Cell-Aware Defect Diagnosis of Customer Retu..:
, In:
?
2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS) ,
12
Development and Application of Embedded Test Instruments to..:
, In:
?
2020 IEEE European Test Symposium (ETS) ,
13
QAMR: an Approximation-Based Fully Reliable TMR Alternative..:
, In:
?
2019 17th IEEE International New Circuits and Systems Conference (NEWCAS) ,
14
A Capacitor-Less CMOS Neuron Circuit for Neuromemristive Ne..:
, In:
?
2019 IEEE 16th International Symposium on Biomedical Imaging (ISBI 2019) ,
15