Girard, Kevin P.
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1

Contributors:

, In: Murray and Nadel's Textbook of Respiratory Medicine,
Adams, Lewis ; Adler, Dan Elie ; Agusti, Alvar... - p. vi-xix , 2016
 
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Predictor BIST: An "All-in-One" Optical Test Solution for C..:

, In: 2023 IEEE International Test Conference (ITC),
Lefevre, J. ; Debaud, P. ; Girard, P.. - p. 310-319 , 2023
 
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6

On Using Cell-Aware Methodology for SRAM Bit Cell Testing:

, In: 2023 IEEE European Test Symposium (ETS),
Xhafa, X. ; Ladhar, A. ; Faehn, E.... - p. 1-4 , 2023
 
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A Generic Fast and Low Cost BIST Solution for CMOS Image Se..:

, In: 2022 IEEE European Test Symposium (ETS),
Lefevre, J. ; Debaud, P. ; Girard, P.. - p. 1-2 , 2022
 
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8

A Comprehensive Learning-Based Flow for Cell-Aware Model Ge..:

, In: 2022 IEEE International Test Conference (ITC),
D'Hondt, P. ; Ladhar, A. ; Girard, P.. - p. 484-488 , 2022
 
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9

Design, Verification, Test and In-Field Implications of App..:

, In: 2020 IEEE European Test Symposium (ETS),
Bosio, A. ; Carlo, S. Di ; Girard, P.... - p. 1-10 , 2020
 
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A Learning-Based Cell-Aware Diagnosis Flow for Industrial C..:

, In: 2020 IEEE International Test Conference (ITC),
Mhamdi, S. ; Girard, P. ; Virazel, A... - p. 1-10 , 2020
 
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11

Learning-Based Cell-Aware Defect Diagnosis of Customer Retu..:

, In: 2020 IEEE European Test Symposium (ETS),
Mhamdi, S. ; Girard, P. ; Virazel, A... - p. 1-2 , 2020
 
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12

Development and Application of Embedded Test Instruments to..:

, In: 2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS),
Azais, F. ; Bernard, S. ; Comte, M.... - p. 1-4 , 2020
 
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14

A Capacitor-Less CMOS Neuron Circuit for Neuromemristive Ne..:

, In: 2019 17th IEEE International New Circuits and Systems Conference (NEWCAS),
Aziza, H. ; Moreau, M. ; Perez, A.. - p. 1-4 , 2019
 
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15

Ensemble Of Neural Networks For High Endothelial Venules De..:

, In: 2019 IEEE 16th International Symposium on Biomedical Imaging (ISBI 2019),
Abreu, A. ; Franchet, C. ; Frenois, F-X.... - p. 938-942 , 2019
 
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