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Glavanovics, M.
1
results:
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1
A common hard-failure mechanism in GaN HEMTs in accelerated..:
, In:
2023 IEEE International Reliability Physics Symposium (IRPS)
,
Wieland, D.
;
Ofner, S.
;
Stabentheiner, M.
... - p. 1-6 , 2023
Link:
https://doi.org/10.1109/..
1-1
