Gong Xiao
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1

Modeling of Ferroelectric Thin Film Transistors with Amorph..:

, In: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Zhang, Wei ; Wang, Jianze ; Sun, Chen... - p. 1-3 , 2024
 
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2

Transposable Memory Based on the Ferroelectric Field-Effect..:

, In: 2024 IEEE International Symposium on Circuits and Systems (ISCAS),
Wang, Jianze ; Zhang, Wei ; Wu, Zhen... - p. 1-5 , 2024
 
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3

The Impact of Thermal Noise in Multi-Domain Hf-based Antife..:

, In: 2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA),
Luo, Sheng ; Zheng, Zijie ; Zhou, Zuopu.. - p. 1-2 , 2024
 
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4

Effects of Source/Drain Electrodes on Thermal Stability of ..:

, In: 2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA),
Kong, Qiwen ; Liu, Long ; Han, Kaizhen... - p. 1-2 , 2024
 
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5

Ferroelectric Probabilistic Bits based on Thermal Noise ind..:

, In: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Luo, Sheng ; He, Yihan ; Cai, Baofang.. - p. 1-3 , 2023
 
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6

In-Situ Encrypted NAND FeFET Array for Secure Storage and C..:

, In: 2023 International Electron Devices Meeting (IEDM),
Zhao, Zijian ; Xu, Yixin ; Read, James... - p. 1-4 , 2023
 
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7

First Demonstration of BEOL-compatible Amorphous InGaZnOx C..:

, In: 2023 International Conference on IC Design and Technology (ICICDT),
Zheng, Zijie ; Xie, Jiawei ; Sun, Yiyuan... - p. 29-33 , 2023
 
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8

First Demonstration of BEOL-Compatible MFMIS Fe-FETs with 3..:

, In: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Wang, Xiaolin ; Zheng, Zijie ; Kong, Qiwen... - p. 1-2 , 2023
 
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9

First Demonstration of BEOL-Compatible Write-Enhanced Ferro..:

, In: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Jiao, Leming ; Han, Kaizhen ; Zhou, Zuopu... - p. 1-2 , 2023
 
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10

First BEOL-compatible IGZO Ferroelectic-Modulated Diode wit..:

, In: 2023 International Electron Devices Meeting (IEDM),
Jiao, Leming ; Zhou, Zuopu ; Zheng, Zijie... - p. 1-4 , 2023
 
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11

First Demonstration of Work Function-Engineered BEOL-Compat..:

, In: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Zheng, Zijie ; Jiao, Leming ; Zhou, Zuopu... - p. 1-2 , 2023
 
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12

Record High Active Boron Doping using Low Temperature In-si..:

, In: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Zheng, Gerui ; Wang, Yuxuan ; Xu, Haiwen... - p. 1-2 , 2023
 
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13

Unveiling the Influence of Channel Thickness on PBTI and LF..:

, In: 2023 International Electron Devices Meeting (IEDM),
Liu, Gan ; Kong, Qiwen ; Wang, Xiaolin... - p. 1-4 , 2023
 
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14

First Study of the Charge Trapping Aggravation Induced by A..:

, In: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Zhou, Zuopu ; Jiao, Leming ; Zheng, Zijie... - p. 1-2 , 2023
 
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15

A Priori Based Deep Unfolding Method for mmWave Channel Est..:

, In: ICC 2023 - IEEE International Conference on Communications,
Yang, Jiapan ; Gong, Xiao ; Ai, Bo. - p. 2946-2951 , 2023
 
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