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2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) ,
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Modeling of Ferroelectric Thin Film Transistors with Amorph..:
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2024 IEEE International Symposium on Circuits and Systems (ISCAS) ,
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Transposable Memory Based on the Ferroelectric Field-Effect..:
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2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA) ,
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The Impact of Thermal Noise in Multi-Domain Hf-based Antife..:
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2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA) ,
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Effects of Source/Drain Electrodes on Thermal Stability of ..:
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2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) ,
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Ferroelectric Probabilistic Bits based on Thermal Noise ind..:
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2023 International Electron Devices Meeting (IEDM) ,
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In-Situ Encrypted NAND FeFET Array for Secure Storage and C..:
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2023 International Conference on IC Design and Technology (ICICDT) ,
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First Demonstration of BEOL-compatible Amorphous InGaZnOx C..:
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2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) ,
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First Demonstration of BEOL-Compatible MFMIS Fe-FETs with 3..:
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2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) ,
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First Demonstration of BEOL-Compatible Write-Enhanced Ferro..:
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2023 International Electron Devices Meeting (IEDM) ,
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First BEOL-compatible IGZO Ferroelectic-Modulated Diode wit..:
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2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) ,
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First Demonstration of Work Function-Engineered BEOL-Compat..:
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2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) ,
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Record High Active Boron Doping using Low Temperature In-si..:
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2023 International Electron Devices Meeting (IEDM) ,
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Unveiling the Influence of Channel Thickness on PBTI and LF..:
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2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) ,
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First Study of the Charge Trapping Aggravation Induced by A..:
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ICC 2023 - IEEE International Conference on Communications ,
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