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González Nafría, N.
1
results:
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1
Channel hot-carriers degradation in MOSFETs: A conductive A..:
, In:
2013 IEEE International Reliability Physics Symposium (IRPS)
,
Bayer, A.
;
Porti, M.
;
Martin-Martinez, J.
... - p. 5D.4.1-5D.4.6 , 2013
Link:
https://doi.org/10.1109/..
1-1
