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Graff, Andreas
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1

Reliability Physics of GaN HEMT Microwave Devices: The Age ..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Zanoni, Enrico ; Meneghini, Matteo ; Meneghesso, Gaudenzio... - p. 1-10 , 2020
Link: https://doi.org/10.1109/..
 
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2

Contributors:

, In: Bio-Economy and Agri-production,
Achillas, Charisios ; Adamides, George ; Alexiou, George... - p. xi-xiv , 2021
Link: https://doi.org/10.1016/..
 
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3

Using the levels of conceptual interoperability model and m..:

, In: Proceedings of the Winter Simulation Conference,
Diallo, Saikou Y. ; Tolk, Andreas ; Graff, Jason. - p. 2576-2586 , 2011
Link: https://dl.acm.org/doi/1..
 
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4

Grundschulforschung zwischen allgemeinen und fachdidaktisch..:

, In: QualitÄt von Grundschulunterricht,
Hartinger, Andreas ; Graff, Thyra ; Kersten, Saskia... - p. 191-199 ,
Link: https://doi.org/10.1007/..
 
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