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Guedj, E.
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Comparative study of non-polar switching behaviors of NiO- ..:

, In: 2010 IEEE International Memory Workshop,
Jousseaume, V. ; Feldis, H. ; Minoret, S.... - p. 1-4 , 2010
Link: https://doi.org/10.1109/..
 
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2

Back-end-of-line integration approaches for resistive memor..:

, In: 2009 IEEE International Interconnect Technology Conference,
Jousseaume, V. ; Buckley, J. ; Bernard, Y.... - p. None , 2009
Link: https://doi.org/10.1109/..
 
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