Gui, Wendong
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Improved Multi-bit Statistics of Novel Dual-gate IGZO 2T0C ..:

, In: 2023 International Electron Devices Meeting (IEDM),
Chen, Kaifei ; Zhu, Zhengyong ; Lu, Wendong... - p. 1-4 , 2023
 
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First Demonstration of Dual-Gate IGZO 2T0C DRAM with Novel ..:

, In: 2022 International Electron Devices Meeting (IEDM),
Lu, Wendong ; Zhu, Zhengyong ; Chen, Kaifei... - p. 26.4.1-26.4.4 , 2022
 
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