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Habersat, Daniel B.
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NUV-Enhanced 4H-SiC SACM APDs:

, In: 2024 Device Research Conference (DRC),
Schuster, Jonathan ; Derenge, Michael A. ; Smith, Jeremy L.... - p. 1-2 , 2024
Link: https://doi.org/10.1109/..
 
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Towards a Robust Approach to Threshold Voltage Characteriza..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Habersat, Daniel B. ; Lelis, Aivars J. ; Green, Ronald - p. 1-4 , 2020
Link: https://doi.org/10.1109/..
 
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