Haw, Alex
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New Circuit Topology for System-Level Reliability of GaN:

, In: 2019 31st International Symposium on Power Semiconductor Devices and ICs (ISPSD),
Lin, Ming-Cheng ; Chang, Wen-Che ; Wu, Haw-Yun... - p. 299-302 , 2019
 
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5

PZT Sector Slitted Ultrasonic Transducer with 9.4× Baseline..:

, In: IECON 2023- 49th Annual Conference of the IEEE Industrial Electronics Society,
 
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