Hayashi, Shin-ichiro
115  results:
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1

Reliability under High Gate-Voltage Condition on SiC MOSFET..:

, In: 2024 IEEE 10th International Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia),
 
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2

High-Performance Driving of SiC MOSFETs to Implement Short-..:

, In: 2023 11th International Conference on Power Electronics and ECCE Asia (ICPE 2023 - ECCE Asia),
Hayashi, Shin-Ichiro ; Wada, Keiji - p. 1485-1490 , 2023
 
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3

Gate Drive Circuit with In situ Condition Monitoring System..:

, In: 2022 IEEE Applied Power Electronics Conference and Exposition (APEC),
Hayashi, Shin-Ichiro ; Wada, Keiji - p. 1838-1845 , 2022
 
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4

Equalization of DC and Surge Components of Drain Current of..:

, In: 2022 IEEE Applied Power Electronics Conference and Exposition (APEC),
Horii, Kohei ; Morikawa, Ryuzo ; Katada, Ryunosuke... - p. 1406-1412 , 2022
 
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5

List of Contributors:

, In: Handbook of Advanced Ceramics,
Abe, Masanori ; Adler, Joerg ; Adschiri, Tadafumi... - p. xxi-xxv , 2013
 
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6

DNA Fragmentation Induced by Intense Burst Sinusoidal Elect..:

, In: 2007 IEEE 34th International Conference on Plasma Science (ICOPS),
 
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7

Study on the Cause of Air Traffic Delay in Fukuoka Approach..:

, In: 2023 Asia-Pacific International Symposium on Aerospace Technology (APISAT 2023) Proceedings; Lecture Notes in Electrical Engineering,
 
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8

Generation of Optimized Trajectories for Congestion Mitigat..:

, In: 2023 Asia-Pacific International Symposium on Aerospace Technology (APISAT 2023) Proceedings; Lecture Notes in Electrical Engineering,
 
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9

Evaluation of Hand Pose Techniques Numerical Teaching Mater..:

, In: 2024 IEEE 18th International Conference on Advanced Motion Control (AMC),
 
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10

Combining Transfer Learning and Genetic Algorithms for Real..:

, In: 2024 10th International Conference on Mechatronics and Robotics Engineering (ICMRE),
 
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11

Application of deep learning to develop intelligent drones ..:

, In: Proceedings of the 2023 8th International Conference on Intelligent Information Technology,
Capi, Genci ; Shirai, Aya ; Kaneko, Shin-ichiro.. - p. 286-293 , 2023
 
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12

Characterizing SEU Cross Sections of 12- and 28-nm SRAMs fo..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
 
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13

Improvement of Radiation Tolerance in Solar Cells by Hetero..:

, In: 2023 IEEE 50th Photovoltaic Specialists Conference (PVSC),
 
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14

Proton Degradation-free Flexible Chalcopyrite Solar Cells W..:

, In: 2023 IEEE 50th Photovoltaic Specialists Conference (PVSC),
 
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15

Data Selection Using Genetic Algorithm to Improve Transfer ..:

, In: 2023 5th International Conference on Control and Robotics (ICCR),
 
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