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2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) ,
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RESURF Region Variation Induced Current Crowding Effect on ..:
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2023 IEEE International Solid- State Circuits Conference (ISSCC) ,
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20.3 A GaN Gate Driver with On-chip Adaptive On-time Contro..:
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2023 IEEE International Reliability Physics Symposium (IRPS) ,
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A Concise Electrothermal Model to Characterize the Thermal ..:
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2023 IEEE International Solid- State Circuits Conference (ISSCC) ,
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30.8 3D Wireless Power Transfer with Noise Cancellation Tec..:
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2023 International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan) ,
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Transmission Line Pulse Width Impacting on Device Performan..:
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2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) ,
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A Combination of Implant Shadow and Skin Effects Leading to..:
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2023 IEEE International Symposium on Circuits and Systems (ISCAS) ,
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Zero-LEINR: Zero-Reference Low-light Image Enhancement with..:
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2023 International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan) ,
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Optimizing Device Metal Routing Layouts by the Simulation T..:
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2023 International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan) ,
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Bipolar Transistors' Holding Phenomena:
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2022 IEEE International Conference on Consumer Electronics - Taiwan ,
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Gate Voltages Impacting on Latch-up Measurements:
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2022 IEEE International Conference on Consumer Electronics - Taiwan ,
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EOS Endurance Power Circuits without Depletion Mode Devices:
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2022 IEEE International Reliability Physics Symposium (IRPS) ,
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Incorporation of a Simple ESD Circuit in a 650V E-Mode GaN ..:
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2020 IEEE International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan) ,
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Signal Control Switching for Improving Large Array Devices'..:
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2020 IEEE International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan) ,
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The Correlations between ESD and TLP in Large Array Devices:
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Proceedings of the 43rd annual Design Automation Conference ,
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