Hu, Yaoqiao
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1

On the Dopant, Defect States, and Mobility in W Doped Amorp..:

, In: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
 
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2

Impact of Device Geometry, Physical Doping and Electrostati..:

, In: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
 
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3

Theoretical and Empirical Insight into Dopant, Mobility and..:

, In: 2022 International Electron Devices Meeting (IEDM),
Hu, Yaoqiao ; Ye, Huacheng ; Aabrar, Khandker Akif... - p. 8.5.1-8.5.4 , 2022
 
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