Huang, Ming-Der
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1

eVTOL, UAM, and AAM: Brief Development History and Implemen..:

, In: 2023 IEEE International Conference on e-Business Engineering (ICEBE),
Tsai, Kuen-Yu ; Meng, Guang-Yun ; Wu, Tung-Ling... - p. 287-296 , 2023
 
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3

Color Refractive Error Exam for Speech Disorder:

, In: 2022 International Symposium on Intelligent Signal Processing and Communication Systems (ISPACS),
 
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4

Fault-Tolerance Mechanism Analysis on NVDLA-Based Design Us..:

, In: 2020 International Symposium on VLSI Design, Automation and Test (VLSI-DAT),
Liu, Shu-Ming ; Tang, Luba ; Huang, Ning-Chi... - p. 1-3 , 2020
 
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5

On-the-Fly Twiddle Factor Generator Design for Efficient Me..:

, In: 2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA),
 
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6

Blended Teaching and Agile Development of Project Managemen..:

, In: 2024 IEEE 7th Eurasian Conference on Educational Innovation (ECEI),
Lin, Chih-Chung ; May, Ming-Der - p. 101-104 , 2024
 
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7

Learning Effectiveness of Digital Game-Based Learning for U..:

, In: 2024 IEEE 7th Eurasian Conference on Educational Innovation (ECEI),
May, Ming-Der ; Tseng, Kuo-An - p. 276-279 , 2024
 
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8

Integrating DGBL and Collaborative Learning in Enterprise R..:

, In: Towards a Hybrid, Flexible and Socially Engaged Higher Education; Lecture Notes in Networks and Systems,
May, Ming-Der - p. 143-154 , 2024
 
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9

Area-Efficient VLSI Architecture of Key Switching for BGV F..:

, In: 2023 30th IEEE International Conference on Electronics, Circuits and Systems (ICECS),
Chen, Kuan-Yu ; Shieh, Ming-Der - p. 1-4 , 2023
 
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10

VLSI Design of Number Theoretic Transform for BGV Fully Hom..:

, In: 2023 International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan),
Chen, Kuan-Yu ; Shieh, Ming-Der - p. 537-538 , 2023
 
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11

A Decision Tree-Based Screening Method for Improving Test Q..:

, In: 2022 IEEE International Test Conference in Asia (ITC-Asia),
Cheng, Ya-Chi ; Tan, Pai-Yu ; Wu, Cheng-Wen... - p. 19-24 , 2022
 
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12

Battery Pack Reliability and Endurance Enhancement for Elec..:

, In: 2022 IEEE 31st Asian Test Symposium (ATS),
Chou, Yu-You ; Wu, Cheng-Wen ; Shieh, Ming-Der. - p. 66-71 , 2022
 
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13

Weak Die Screening by Feature Prioritized Random Forest for..:

, In: 2022 IEEE International Test Conference in Asia (ITC-Asia),
Lin, Shian-Yu ; Tan, Pai-Yu ; Wu, Cheng-Wen... - p. 25-30 , 2022
 
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14

Efficient VLSI Architecture of Bluestein's FFT for Fully Ho..:

, In: 2022 IEEE International Symposium on Circuits and Systems (ISCAS),
Wu, Shi-Yong ; Chen, Kuan-Yu ; Shieh, Ming-Der - p. 2242-2245 , 2022
 
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15

Improving Test Quality of Memory Chips by a Decision Tree-B..:

, In: 2022 IEEE International Test Conference (ITC),
Cheng, Ya-Chi ; Tan, Pai-Yu ; Wu, Cheng-Wen... - p. 601-608 , 2022
 
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