Huesgen, T
1  results:
Search for persons X
?
1

Reliability prediction sensitivity analysis — How to perfor..:

, In: 6th IET International Conference on Power Electronics, Machines and Drives (PEMD 2012),
Riedel, G. J. ; Huesgen, T. ; Schmidt, R. - p. 1-6 , 2012
 
1-1