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Hur, Hoon
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1

A Noble Design Methodology to Minimize Plasma Induced Damag..:

, In: 2023 International Electron Devices Meeting (IEDM),
Lee, Se Hoon ; Um, Junghwan ; Kim, Kanglib... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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2

Bridging Service Employees' Perceptions of CSR and Organiza..:

, In: Key Topics in Work and Organizational Psychology; Key Topics in Behavioral Sciences,
Ko, Sung-Hoon ; Moon, Tae-Won ; Hur, Won-Moo - p. 11-26 , 2022
Link: https://doi.org/10.1007/..
 
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3

Highly Reliable Cell Characteristics with CSOB(Channel-hole..:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
Kang, Jin-kyu ; Lee, Jaeduk ; Yim, Yongsik... - p. 10.1.1-10.1.4 , 2021
Link: https://doi.org/10.1109/..
 
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4

Unveiling Hardware-based Data Prefetcher, a Hidden Source o..:

, In: Proceedings of the 2018 ACM SIGSAC Conference on Computer and Communications Security,
Shin, Youngjoo ; Kim, Hyung Chan ; Kwon, Dokeun.. - p. 131-145 , 2018
Link: https://dl.acm.org/doi/1..
 
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5

Effct of target poisoning on the growth of interfacial laye..:

, In: 2016 IEEE International Conference on Plasma Science (ICOPS),
Lee, Jin Young ; Kang, Woo Seok ; Hur, Min.. - p. 1-1 , 2016
Link: https://doi.org/10.1109/..
 
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6

A study on the L1 optimal PD controller with application to..:

, In: 2016 IEEE International Conference on Robotics and Automation (ICRA),
Jung Hoon, Kim ; Hur, Sung-moon ; Lee, Jongwoo. - p. 5696-5701 , 2016
Link: https://doi.org/10.1109/..
 
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7

Erosion rate for different electrode materials in an AC elo..:

, In: 2013 Abstracts IEEE International Conference on Plasma Science (ICOPS),
Kim, Kwan-Tae ; Kang, Hee Seok ; Lee, Dae Hoon.. - p. 1-1 , 2013
Link: https://doi.org/10.1109/..
 
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