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2023 11th International IEEE/EMBS Conference on Neural Engineering (NER) ,
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Quantifying changes in local basal ganglia structural conne..:
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2019 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) ,
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Relationship between capacitance and conductance in MOS cap..:
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2023 IEEE International Integrated Reliability Workshop (IIRW) ,
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Electrically active defects in Al2O3-InGaAs MOS stacks at c..:
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2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) ,
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Impact of Device Geometry, Physical Doping and Electrostati..:
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Oxford Studies in Normative Ethics Volume 12 ,
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The Consequentializing Argument Against…Consequentializing?:
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The Oxford handbook of consequentialism / edited by Douglas W. Portmore
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Consequentiualizing:
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2014 IEEE International Integrated Reliability Workshop Final Report (IIRW) ,
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