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Jan, Tz-Yun
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1

Modeling Fatigue-Breakdown Dilemma in Ferroelectric Hf0.5 Z..:

, In: 2022 International Electron Devices Meeting (IEDM),
Huang, Hsin-Hui ; Cho, Chen-Yi ; Lin, Tzu-Yao... - p. 13.5.1-13.5.4 , 2022
Link: https://doi.org/10.1109/..
 
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2

Si Metal-Oxide-Semiconductor and Si/SiGe Heterostructure Qu..:

, In: 2022 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA),
Wu, Yu-Jui ; Chiang, Chih-Ying ; Tsao, Hung-Yu... - p. 1-2 , 2022
Link: https://doi.org/10.1109/..
 
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3

Developing a Game-Based Speech Recognition System to Facili..:

, In: Lecture Notes in Computer Science; Innovative Technologies and Learning,
Lin, Yen-Ting ; Wang, Tz-Chi ; Yi, Yun-Jhih - p. 3-12 , 2022
Link: https://doi.org/10.1007/..
 
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4

Area Scalable Hafnium-Zirconium-Oxide Ferroelectric Capacit..:

, In: 2022 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA),
Huang, Tz-Shiuan ; Yeh, Po-Chun ; Yang, Hsin-Yun... - p. 1-2 , 2022
Link: https://doi.org/10.1109/..
 
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5

Don't Look Back, Look into the Future : Prescient Data P..:

, In: Proceedings of the 2021 International Conference on Management of Data,
Lin, Yu-Shan ; Tsai, Ching ; Lin, Tz-Yu.. - p. 1156-1168 , 2021
Link: https://dl.acm.org/doi/1..
 
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