E-LIB Suche - Ergebnisse für: Jeong, W.

1

Brillouin optical correlation domain analysis system with a..:

, In: 49th European Conference on Optical Communications (ECOC 2023),

Jeong, W. ; Song, K. ; Kim, G.. - p. None , 2023

Link: https://doi.org/10.1049/..

2

Soft Wireless Optogenetic and Hybrid Implants for Advanced ..:

, In: 2022 International Electron Devices Meeting (IEDM),

Jeong, J.-W. - p. 29.2.1-29.2.4 , 2022

Link: https://doi.org/10.1109/..

3

Comparison of conductive fabric sensor and Ag-AgCl sensor u..:

, In: 2008 30th Annual International Conference of the IEEE Engineering in Medicine and Biology Society,

Lee, I.B. ; Shin, S.C. ; Jang, Y.W.... - p. None , 2008

Link: https://doi.org/10.1109/..

4

EBE growth and properties of CuInS/sub 2/ thin film:

, In: International Conference on Science and Technology of Synthetic Metals,

Park, G.C. ; Jeong, J.W. - p. 670 , 1994

Link: https://doi.org/10.1109/..

5

Device Design and Reliability of GAA MBCFET:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),

Kang, M. ; Chang, M. ; Park, Y.... - p. 1-6 , 2024

Link: https://doi.org/10.1109/..

6

Implementation of the 160kV High Voltage DC/DC Converter:

, In: 2023 11th International Conference on Power Electronics and ECCE Asia (ICPE 2023 - ECCE Asia),

Jeong, W.C. ; Lee, J.Y. ; Choi, M.K.. - p. 2867-2872 , 2023

Link: https://doi.org/10.23919..

7

True 7nm Platform Technology featuring Smallest FinFET and ..:

, In: 2018 IEEE Symposium on VLSI Technology,

Jeong, W.C. ; Kwon, D.J. ; Nam, K.J.... - p. 59-60 , 2018

Link: https://doi.org/10.1109/..

8

Fully integrated 64 Kb MRAM with novel reference cell schem:

, In: Digest. International Electron Devices Meeting,,

Jeong, H.S. ; Kim, H.J. ; Hong, J.S.... - p. 551,552,553,554 , 2002

Link: https://doi.org/10.1109/..

9

Within-Chip Bridged-Pattern Short Detection Using Spatially..:

, In: 2024 IEEE 33rd Microelectronics Design & Test Symposium (MDTS),

Lin, C.Y. ; Ogino, A. ; Lee, C.H.... - p. 1-3 , 2024

Link: https://doi.org/10.1109/..

10

Design and Analysis of Discrete FET Monitors in 7nm FinFET ..:

, In: 2023 35th International Conference on Microelectronic Test Structure (ICMTS),

Vidya, V. ; Zamdmer, N. ; Mechler, T.... - p. 1-3 , 2023

Link: https://doi.org/10.1109/..

11

Contact Fail Monitoring with an Epi Resistance Test Structu..:

, In: 2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS),

Lee, C.H. ; Jeong, B.W. ; Wu, S.... - p. 1-3 , 2022

Link: https://doi.org/10.1109/..

12

Si FinFET based 10nm technology with multi Vt gate stack fo..:

, In: 2016 IEEE Symposium on VLSI Technology,

Cho, H.-J. ; Oh, H.S. ; Nam, K.J.... - p. 1-2 , 2016

Link: https://doi.org/10.1109/..

13

Laterally-driven deformation-robust MEMS gyroscopes with th..:

, In: TRANSDUCERS 2009 - 2009 International Solid-State Sensors, Actuators and Microsystems Conference,

Degawa, M. ; Jeong, H.W. ; Sonobe, H.... - p. None , 2009

Link: https://doi.org/10.1109/..

14

Novel Heat Dissipating Cell Scheme for Improving a Reset Di..:

, In: 2007 IEEE Symposium on VLSI Technology,

Kang, D.H. ; Yu, J. ; Kong, J.H.... - p. None , 2007

Link: https://doi.org/10.1109/..

15

Highly Reliable 256Mb PRAM with Advanced Ring Contact Techn..:

, In: 2006 Symposium on VLSI Technology, 2006. Digest of Technical Papers.,

Song, Y.J. ; Kong, J. ; Ahn, S.... - p. 118-119 , 2006

Link: https://doi.org/10.1109/..