I agree that this site is using cookies. You can find further informations here.
X
Jiejie, Guo
8  results:
Bookchapter (Online) X
Search for persons X
?
1

Sensor Optimization in Large Spaces Based on RBF Neural Net..:

, In: 2023 9th Annual International Conference on Network and Information Systems for Computers (ICNISC),
Qin, Zhenkun ; Guo, Jiejie ; Li, Yuanxun. - p. 488-491 , 2023
Link: https://doi.org/10.1109/..
 
?
2

SNR-Adaptive Multi-Layer Semantic Communication for Speech:

, In: 2023 IEEE 34th Annual International Symposium on Personal, Indoor and Mobile Radio Communications (PIMRC),
Guo, Jiejie ; Zhang, Yimeng ; Liu, Chenyao.. - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
?
3

Research and Application on Modeling and Sharing Technologi..:

, In: 2024 9th Asia Conference on Power and Electrical Engineering (ACPEE),
Ren, Hui ; Sun, Yang ; Li, Yan... - p. 1774-1779 , 2024
Link: https://doi.org/10.1109/..
 
?
4

GaN Tunneling Hot Electron Transistors with UID-GaN/AlN Emi..:

, In: 2023 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP),
Li, Mengdi ; Zhu, Jiejie ; Zhang, Yingcong... - p. 1-3 , 2023
Link: https://doi.org/10.1109/..
 
?
5

MBE-Regrowth Ohmics in AlN/GaN HEMTs with the Rc of 0.09 Ω·..:

, In: 2023 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP),
Qin, Lingjie ; Zhu, Jiejie ; Guo, Jingshu... - p. 1-3 , 2023
Link: https://doi.org/10.1109/..
 
?
6

Influence of Upper Channel Layer Thickness on Traps in Doub..:

, In: 2023 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP),
Guo, Si-Yin ; Zhu, Qing ; Chen, Yi-Lin... - p. 1-3 , 2023
Link: https://doi.org/10.1109/..
 
?
7

A Graded-Gate Structure of AlN/GaN HEMT for High-Linearity ..:

, In: 2022 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP),
Zhang, Bowen ; Zhu, Jiejie ; Liu, Siyu... - p. 1-3 , 2022
Link: https://doi.org/10.1109/..
 
?
8

Gate leakage mechanisms of AlN/GaN High electron mobility t..:

, In: 2022 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP),
Qin, Lingjie ; Zhu, Jiejie ; Liu, Siyu... - p. 1-3 , 2022
Link: https://doi.org/10.1109/..
 
1-8