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Kamino, Takeshi
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A Study of On-state Breakdown Decreasing of nLDMOSFETs by H..:

, In: 2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD),
Mori, Takahiro ; Yamaguchi, Tomonari ; Kamino, Takeshi... - p. 30-33 , 2020
Link: https://doi.org/10.1109/..
 
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A technique for phase-detection auto focus under near-infra..:

, In: 2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD),
Kunikiyo, Tatsuya ; Sato, Hidenori ; Kamino, Takeshi... - p. 137-140 , 2020
Link: https://doi.org/10.23919..
 
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