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2023 IEEE International Reliability Physics Symposium (IRPS) ,
1
Reliability issues of gate oxides and $p-n$ junctions for v..:
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2023 International Electron Devices Meeting (IEDM) ,
2
Polarization Engineering in AlSiO/p-type GaN MOSFETs Using ..:
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2019 Compound Semiconductor Week (CSW) ,
3