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Kikuta, Fernando Kenji
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1

Reliability issues of gate oxides and $p-n$ junctions for v..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Narita, Tetsuo ; Kikuta, Daigo ; Ito, Kenji... - p. 1-10 , 2023
Link: https://doi.org/10.1109/..
 
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2

Polarization Engineering in AlSiO/p-type GaN MOSFETs Using ..:

, In: 2023 International Electron Devices Meeting (IEDM),
Ito, Kenji ; Narita, Tetsuo ; Iguchi, Hiroko... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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3

Analysis of threshold voltage in GaN MOSFETs on homoepitaxi..:

, In: 2019 Compound Semiconductor Week (CSW),
Kikuta, Daigo ; Ito, Kenji ; Narita, Tetsuo. - p. 1-1 , 2019
Link: https://doi.org/10.1109/..
 
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