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Kim, G H
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1

Device Design and Reliability of GAA MBCFET:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Kang, M. ; Chang, M. ; Park, Y.... - p. 1-6 , 2024
Link: https://doi.org/10.1109/..
 
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2

A novel evaluation method of virtual power plant effect on ..:

, In: 27th International Conference on Electricity Distribution (CIRED 2023),
Hwang, J. ; Lee, J.-O. ; Kim, G.-H.. - p. None , 2023
Link: https://doi.org/10.1049/..
 
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3

List of Contributors:

, In: Environmental Materials and Waste,
Astrup, T. ; Bashir, S. ; Beckett, P.... - p. xix-xxiii , 2016
Link: https://doi.org/10.1016/..
 
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4

Measurement of plasma parameters by electric probes in a si..:

, In: IEEE Conference Record - Abstracts. 1999 IEEE International Conference on Plasma Science. 26th IEEE International Conference (Cat. No.99CH36297),
Chung, K.-S. ; Choi, Y.-S. ; Chang, D.-H.... - p. 244 , 1999
Link: https://doi.org/10.1109/..
 
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5

Characterization of an ECR etching plasma with a microwave ..:

, In: International Conference on Plasma Sciences (ICOPS),
Breun, R. ; Goeckner, M. ; Meyer, J.... - p. 141 , 1993
Link: https://doi.org/10.1109/..
 
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6

Lg = 60 nm In0.53 Ga0.47 As MBCFETs: From gm_max = 13.7 mS/..:

, In: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Yoo, J.-H. ; Jo, H.-B. ; Lee, I.-G.... - p. 1-2 , 2023
Link: https://doi.org/10.23919..
 
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7

List of Contributors:

, In: Molecular Breeding and Nutritional Aspects of Buckwheat,
Aii, J. ; Archak, S. ; Barsukova, Y.N.... - p. xiii-xvii , 2016
Link: https://doi.org/10.1016/..
 
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8

A simple capacitor votage balancing scheme for the cascaded..:

, In: 6th IET International Conference on Power Electronics, Machines and Drives (PEMD 2012),
Chun, T. W. ; Tran, Q. V. ; Lee, H. H... - p. 1-5 , 2012
Link: https://doi.org/10.1049/..
 
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9

Techniques of Robot Assisted Extracorporeal Urinary Diversi..:

, In: Robotic Urology,
Kim, Albert H. ; Chan, Kevin G. - p. 335-346 , 2024
Link: https://doi.org/10.1007/..
 
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10

Feed Rate Optimization Using NC Cutting Load Maps:

, In: Flexible Automation and Intelligent Manufacturing: Establishing Bridges for More Sustainable Manufacturing Systems; Lecture Notes in Mechanical Engineering,
Yoo, N. H. ; Kim, S. G. ; Kim, T. H... - p. 302-310 , 2023
Link: https://doi.org/10.1007/..
 
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11

Ongoing Evolution of DRAM Scaling via Third Dimension -Vert..:

, In: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Han, J.W. ; Park, S.H. ; Jeong, M.Y.... - p. 1-2 , 2023
Link: https://doi.org/10.23919..
 
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12

List of contributors:

, In: Epigenetic Cancer Therapy,
Altucci, Lucia ; Alvarez, Rosana ; Aprile, Marianna... - p. xxi-xxv , 2023
Link: https://doi.org/10.1016/..
 
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13

A Heavy-Ion Single-Event Effects Test Facility at Michigan ..:

, In: 2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC),
Lidia, S. ; Cogan, S. ; Fukushima, K.... - p. 1-7 , 2022
Link: https://doi.org/10.1109/..
 
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14

Development of FD-SOI cryogenic amplifier for application t..:

, In: 2021 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA),
Takeuchi, Y. ; Kim, S.H. ; Iida, T.... - p. 1-2 , 2021
Link: https://doi.org/10.1109/..
 
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15

List of Contributors:

, In: Work Across the Lifespan,
Agbeke, Della V. ; Anderson, Kemol J. ; Matthijs Bal, P.... - p. xix-xxii , 2019
Link: https://doi.org/10.1016/..
 
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