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Kim, Hanseung
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1

A Comprehensive Study of Read-After-Write-Delay for Ferroel..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Myeong, Ilho ; Lim, Suhwan ; Kim, Taeyoung... - p. 9B.3-1-9B.3-6 , 2024
Link: https://doi.org/10.1109/..
 
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2

Drain Current Degradation Induced by Charge Trapping/De-Tra..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Kim, Taeyoung ; Lim, Suhwan ; Myeong, Ilho... - p. P6.EM-1-P6.EM-4 , 2024
Link: https://doi.org/10.1109/..
 
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3

Comprehensive Design Guidelines of Gate Stack for QLC and H..:

, In: 2023 International Electron Devices Meeting (IEDM),
Lim, Suhwan ; Kim, Taeyoung ; Myeong, Ilho... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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4

Advanced Color Filter Isolation Technology for Sub-Micron P..:

, In: 2022 International Electron Devices Meeting (IEDM),
Bak, Hojin ; Lee, Horyeong ; Kim, Won-Jin... - p. 37.6.1-37.6.4 , 2022
Link: https://doi.org/10.1109/..
 
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5

Vehicle-to-Grid Charging Optimization of Electric Vehicle:

, In: 2020 IEEE Conference on Control Technology and Applications (CCTA),
Kim, Hyunsup ; Myeong, Hanseung ; Park, Inseok.. - p. 1-6 , 2020
Link: https://doi.org/10.1109/..
 
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6

A scalable and persistent key-value store using non-volatil..:

, In: Proceedings of the 34th ACM/SIGAPP Symposium on Applied Computing,
Kim, Doyoung ; Choi, Won Gi ; Sung, Hanseung. - p. 464-467 , 2019
Link: https://dl.acm.org/doi/1..
 
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