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2024 International Conference on Electronics Packaging (ICEP) ,
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Non-Destructive Orientation Mapping with X-ray Diffraction ..:
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2024 IEEE International Reliability Physics Symposium (IRPS) ,
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On-Chip Characterization of Random Telegraph Signal Noise i..:
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2024 IEEE 42nd VLSI Test Symposium (VTS) ,
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A Discovery Platform to Characterize Emerging Nonvolatile M..:
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2024 IEEE International Reliability Physics Symposium (IRPS) ,
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Characterization of Interface Trap Density in SiC MOSFETs S..:
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27th International Conference on Electricity Distribution (CIRED 2023) ,
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Incentive design for hybrid ESS considering additional serv..:
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Springer Proceedings in Physics; Proceedings of the 2023 Water Reactor Fuel Performance Meeting ,
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Numerical Calculation on Thermal Expansion Of UO2 – 3 Vol% ..:
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27th International Conference on Electricity Distribution (CIRED 2023) ,
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A study on variable renewable energy grid connection code f..:
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2023 International Electron Devices Meeting (IEDM) ,
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A silicon photonic 8λ, x 32Gbps/λ, WDM transceiver with int..:
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27th International Conference on Electricity Distribution (CIRED 2023) ,
9
MVDC Distribution system application scenarios and economic..:
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2023 IEEE International Reliability Physics Symposium (IRPS) ,
10
TID Response of an Analog In-Memory Neural Network Accelera..:
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2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD) ,
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Hybrid scanning technique for dose reduction and image qual..:
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2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD) ,
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Development of Cosmic Neutron Spectrometer using 3He Propor..:
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Advances in the Analysis and Design of Marine Structures ,
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Fluid-structure interaction simulations using a hydrodynami..:
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27th International Conference on Electricity Distribution (CIRED 2023) ,
14
Development of underground cable for LVDC of 1MW class:
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2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD) ,
15