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Kim, W.
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1

Device Design and Reliability of GAA MBCFET:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Kang, M. ; Chang, M. ; Park, Y.... - p. 1-6 , 2024
Link: https://doi.org/10.1109/..
 
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2

A Regression Model for Tool Wear and Breakage Diagnosis:

, In: Lecture Notes in Mechanical Engineering; Flexible Automation and Intelligent Manufacturing: The Human-Data-Technology Nexus,
Kim, S. G. ; Heo, E. Y. ; Lee, H. G.... - p. 171-179 , 2023
Link: https://doi.org/10.1007/..
 
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3

An Adaptive Control for NC Machining Using Reference Contro..:

, In: Lecture Notes in Mechanical Engineering; Flexible Automation and Intelligent Manufacturing: The Human-Data-Technology Nexus,
Kim, S. G. ; Heo, E. Y. ; Lee, H. G... - p. 180-190 , 2023
Link: https://doi.org/10.1007/..
 
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4

A Comprehensive Study on the Pillar Size of OTS-PCM Memory ..:

, In: 2023 IEEE International Memory Workshop (IMW),
Chien, W.C. ; Lai, E.K. ; Buzi, L.... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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5

Optical Diagnostics for The Interactions of HE Atmospheric ..:

, In: 2022 IEEE International Conference on Plasma Science (ICOPS),
Kim, J. W. ; Lee, H. Y. ; Lee, H. J. - p. 1-1 , 2022
Link: https://doi.org/10.1109/..
 
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6

Comprehensive Feasibility Study of Single FIN Transistors f..:

, In: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Fukutome, H. ; Suh, K. ; Kim, W.... - p. 369-370 , 2022
Link: https://doi.org/10.1109/..
 
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7

Design exploration of IGZO diode based VCMA array design fo..:

, In: ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC),
Gupta, M. ; Perumkunnil, M. ; Fantini, A.... - p. 241-244 , 2022
Link: https://doi.org/10.1109/..
 
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8

STT-MRAM array performance improvement through optimization..:

, In: 2021 IEEE International Memory Workshop (IMW),
Rao, S. ; Kim, W. ; van Beek, S.... - p. 1-4 , 2021
Link: https://doi.org/10.1109/..
 
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9

Si Incorporation Into AsSeGe Chalcogenides for High Thermal..:

, In: 2020 IEEE Symposium on VLSI Technology,
Cheng, H. Y. ; Kuo, I. T. ; Chien, W C.... - p. 1-2 , 2020
Link: https://doi.org/10.1109/..
 
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10

A no-verification Multi-Level-Cell (MLC) operation in Cross..:

, In: 2020 IEEE Symposium on VLSI Technology,
Gong, N. ; Chien, W. ; Chou, Y.... - p. 1-2 , 2020
Link: https://doi.org/10.1109/..
 
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11

Reliability of Industrial grade Embedded-STT-MRAM:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Ji, Y. ; Goo, H. ; Lim, J.... - p. 1-3 , 2020
Link: https://doi.org/10.1109/..
 
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12

Deterministic and field-free voltage-controlled MRAM for hi..:

, In: 2020 IEEE Symposium on VLSI Technology,
Wu, Y. C. ; Kim, W. ; Garello, K.... - p. 1-2 , 2020
Link: https://doi.org/10.1109/..
 
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13

Double-Ring-Pumped Nd:YVO4 Laser with a High-Order Laguerre..:

, In: 2019 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC),
Kim, T. H. ; Kim, D. J. ; Kim, J. W. - p. 1-1 , 2019
Link: https://doi.org/10.1109/..
 
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14

Protein Translation in Parkinson's Disease:

, In: Parkinson's Disease,
Kim, J.W. ; Abalde-Atristain, L. ; Jia, H.... - p. 281-309 , 2017
Link: https://doi.org/10.1016/..
 
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15

Si FinFET based 10nm technology with multi Vt gate stack fo..:

, In: 2016 IEEE Symposium on VLSI Technology,
Cho, H.-J. ; Oh, H.S. ; Nam, K.J.... - p. 1-2 , 2016
Link: https://doi.org/10.1109/..
 
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