Ko, Jennifer K. Y.
473  results:
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1

Contributors:

, In: Nerves and Nerve Injuries,
Abel, Naomi ; Agazzi, Siviero ; Ahmadian, Amir... - p. xxv-xxix , 2015
 
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2

SDGen: A Scalable, Reproducible and Flexible Approach to Ge..:

, In: Communications in Computer and Information Science; Ubiquitous Security,
Koay, Abigail M. Y. ; Xie, Miao ; Ko, Ryan K. L.... - p. 102-115 , 2022
 
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3

List of contributors:

, In: Handbook of Properties of Textile and Technical Fibres,
Afshari, Mehdi ; Baley, Christophe ; Bechtold, Thomas... - p. xiii-xiv , 2018
 
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4

Engineering properties of spider silk:

, In: Handbook of Properties of Textile and Technical Fibres,
Ko, Frank K. ; Wan, Lynn Y. - p. 185-220 , 2018
 
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5

Contributors:

, In: The Cloud Security Ecosystem,
Agrawal, Vivek ; Ali, Abdussalam ; Bergmann, Olaf... - p. xix-xxi , 2015
 
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6

Provenance for cloud data accountability:

, In: The Cloud Security Ecosystem,
Tan, Alan Y.S. ; Ko, Ryan K.L. ; Holmes, Geoff. - p. 171-185 , 2015
 
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7

Contributor contact details:

, In: Nanofibers and Nanotechnology in Textiles,
Brown, P.J. ; Stevens, K. ; Salem, David R.... - p. xiii-xvi , 2007
 
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8

Contributor contact details:

, In: Wearable Electronics and Photonics,
Tao, Xiaoming ; Ko, Frank K. ; El-Aufy, Afaf... - p. ix-xi , 2005
 
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9

A novel distributed control system for plasma immersion ion..:

, In: 25th Anniversary, IEEE Conference Record - Abstracts. 1998 IEEE International Conference on Plasma Science (Cat. No.98CH36221),
Liu, A.G. ; Wang, X.F. ; Tang, B.Y.... - p. 216 , 1998
 
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10

Design and Analysis of Discrete FET Monitors in 7nm FinFET ..:

, In: 2023 35th International Conference on Microelectronic Test Structure (ICMTS),
Vidya, V. ; Zamdmer, N. ; Mechler, T.... - p. 1-3 , 2023
 
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11

Contributor contact details:

, In: Nanostructured Metals and Alloys,
Whang, S.H. ; Valiev, R.Z. ; Tsuji, N.... - p. xv-xix , 2011
 
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12

Measurement of plasma parameters by electric probes in a si..:

, In: IEEE Conference Record - Abstracts. 1999 IEEE International Conference on Plasma Science. 26th IEEE International Conference (Cat. No.99CH36297),
Chung, K.-S. ; Choi, Y.-S. ; Chang, D.-H.... - p. 244 , 1999
 
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13

Contributors:

, In: Perioperative Medicine,
 
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15

Bilateral comparison of RF power measurements with 2.4 mm c..:

, In: 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016),
 
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