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Ko, Junghyeon
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Ultra-high Tunneling Electroresistance Ratio (2 × 104) & En..:

, In: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Hwang, Junghyeon ; Kim, Chaeheon ; Shin, Hunbeom... - p. 1-2 , 2023
Link: https://doi.org/10.23919..
 
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A Highly Integrated Crosspoint Array Using Self-rectifying ..:

, In: ESSCIRC 2022- IEEE 48th European Solid State Circuits Conference (ESSCIRC),
Lim, Sehee ; Goh, Youngin ; Lee, Young Kyu... - p. 113-116 , 2022
Link: https://doi.org/10.1109/..
 
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