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Kwon, H.Y.
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1

Field demonstration of 3×341-Gb/s PDM-OFDM-256 iterative po..:

, In: OFC 2014,
Chandrasekhar, S. ; Liu, Xiang ; Winzer, P. J.... - p. 1-3 , 2014
Link: https://doi.org/10.1364/..
 
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2

Comprehensive study on prediction of endurance properties f..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Sato, H. ; Shin, H. M. ; Jung, H.... - p. 1-5 , 2023
Link: https://doi.org/10.1109/..
 
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3

First Fire-free, Low-voltage (~1.2 V), and Low Off-current ..:

, In: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Vaziri, S. ; Datye, I. M. ; Ambrosi, E.... - p. 324-325 , 2022
Link: https://doi.org/10.1109/..
 
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4

Origins and Signatures of Tail Bit Failures in Ultrathin Mg..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Lim, J. H. ; Raghavan, N. ; Kwon, J. H.... - p. 1-5 , 2020
Link: https://doi.org/10.1109/..
 
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5

Effects of initial alloy on microstructure and magnetic pro..:

, In: 2018 IEEE International Magnetics Conference (INTERMAG),
Lee, J. ; Yoo, J. ; Baek, Y... - p. 1-1 , 2018
Link: https://doi.org/10.1109/..
 
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6

A 16-channel Active-Matrix Mini-LED Driver with an USI-B fo..:

, In: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Kwon, Y. ; Kwak, Y. ; Choi, Y.... - p. 1-2 , 2023
Link: https://doi.org/10.23919..
 
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7

A Holistic Methodology Toward Large-scale AI Implementation..:

, In: 2023 International Electron Devices Meeting (IEDM),
Park, S. ; Kim, J. ; Koo, W.... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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8

Lg = 60 nm In0.53 Ga0.47 As MBCFETs: From gm_max = 13.7 mS/..:

, In: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Yoo, J.-H. ; Jo, H.-B. ; Lee, I.-G.... - p. 1-2 , 2023
Link: https://doi.org/10.23919..
 
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9

Lg = 130 nm GAA MBCFETs with three-level stacked In0.53Ga0...:

, In: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Jo, H. -B. ; Lee, I.-G. ; Baek, J. -M.... - p. 397-398 , 2022
Link: https://doi.org/10.1109/..
 
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10

A Low Noise Read-Out IC with Gate Driver for Full Front Dis..:

, In: 2020 IEEE Symposium on VLSI Circuits,
Kwon, Y. ; Kim, M. ; Park, S.... - p. 1-2 , 2020
Link: https://doi.org/10.1109/..
 
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11

PQR laser can outdo LED:

, In: 2006 IEEE Nanotechnology Materials and Devices Conference,
Kwon, O'Dae ; Kim, Y.C. ; Jung, T.S.... - p. None , 2006
Link: https://doi.org/10.1109/..
 
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12

A novel MEMS probe array for the biological measurement:

, In: IEEE MTT-S International Microwave Symposium Digest, 2005.,
Kim, J.M. ; Oh, D.H. ; Baek, C.-W.... - p. None , 2005
Link: https://doi.org/10.1109/..
 
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13

Device Design and Reliability of GAA MBCFET:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Kang, M. ; Chang, M. ; Park, Y.... - p. 1-6 , 2024
Link: https://doi.org/10.1109/..
 
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14

List of Contributors:

, In: Diastology,
Andersen, Øyvind Senstad ; Anderson, Bonita A. ; Appleton, Christopher P.... - p. v-viii , 2021
Link: https://doi.org/10.1016/..
 
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15

Contributors:

, In: Handbook of Metal Injection Molding,
Ahn, S. ; Atre, S.V. ; Banerjee, S.... - p. xiii-xiv , 2019
Link: https://doi.org/10.1016/..
 
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