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Lee, Minah
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1

Measurement of Aging Effect on an Analog Computing-In-Memor..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Wang, Wei-Chun ; Zhang, Shida ; Sharma, Sudarshan.. - p. 1-4 , 2024
Link: https://doi.org/10.1109/..
 
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2

CLUE: Cross-Layer Uncertainty Estimator for Reliable Neural..:

, In: 2023 International Joint Conference on Neural Networks (IJCNN),
Lee, Minah ; Lu, Anni ; Mukherjee, Mandovi.. - p. 01-08 , 2023
Link: https://doi.org/10.1109/..
 
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3

Energy-Efficient Sensor Platform using Reliable Analog-to-F..:

, In: 2023 IEEE SENSORS,
Lee, Minah ; Sharma, Sudarshan ; Wang, Wei Chun. - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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4

AFE-CIM: A Current-Domain Compute-In-Memory Macro for Analo..:

, In: ESSCIRC 2023- IEEE 49th European Solid State Circuits Conference (ESSCIRC),
Sharma, Sudarshan ; Wang, Wei-Chun ; DeLude, Coleman... - p. 33-36 , 2023
Link: https://doi.org/10.1109/..
 
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5

Cool-CIM: Cryogenic Operation of Analog Compute-In-Memory f..:

, In: 2023 International Electron Devices Meeting (IEDM),
Wang, Wei-Chun ; Saligram, Rakshith ; Sharma, Sudarshan... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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6

Lightweight Model Uncertainty Estimation for Deep Neural Ob..:

, In: 2022 International Joint Conference on Neural Networks (IJCNN),
Lee, Minah ; Mudassar, Burhan ; Mukhopadhyay, Saibal - p. 1-8 , 2022
Link: https://doi.org/10.1109/..
 
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7

WarningNet : a deep learning platform for early warning ..:

, In: Proceedings of the 57th ACM/EDAC/IEEE Design Automation Conference,
Lee, Minah ; Mudassar, Burhan ; Na, Taesik. - p. 1-6 , 2020
Link: https://dl.acm.org/doi/1..
 
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8

Algorithm-Circuit Cross-layer Control for Digital Pixel Ima..:

, In: 2020 IEEE Sensors,
Mukherjee, Mandovi ; Mudassar, Burhan Ahmad ; Lee, Minah. - p. 1-4 , 2020
Link: https://doi.org/10.1109/..
 
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9

Effect of Process Variations in Digital Pixel Circuits on t..:

, In: 2020 2nd IEEE International Conference on Artificial Intelligence Circuits and Systems (AICAS),
Lee, Minah ; Mukherjee, Mandovi ; Saha, Priyabrata... - p. 296-300 , 2020
Link: https://doi.org/10.1109/..
 
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10

WarningNet: A Deep Learning Platform for Early Warning of T..:

, In: 2020 57th ACM/IEEE Design Automation Conference (DAC),
Lee, Minah ; Mudassar, Burhan ; Na, Taesik. - p. 1-6 , 2020
Link: https://doi.org/10.1109/..
 
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11

Architecture, Chip, and Package Co-design Flow for 2.5D IC ..:

, In: Proceedings of the 56th Annual Design Automation Conference 2019,
Kim, Jinwoo ; Murali, Gauthaman ; Park, Heechun... - p. 1-6 , 2019
Link: https://dl.acm.org/doi/1..
 
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12

Label-Free Detection and Discrimination of SARS-CoV-2 Varia..:

, In: 2022 47th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz),
Jang, Jeongmin ; Lee, Yeon Kyung ; Roh, Yeeun.. - p. 1-2 , 2022
Link: https://doi.org/10.1109/..
 
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13

Advanced Terahertz Imaging Applications beyond Absorption C..:

, In: 2022 47th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz),
Lee, Sang-Hun ; Roh, Yeeun ; Lee, Geon.. - p. 1-2 , 2022
Link: https://doi.org/10.1109/..
 
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14

Nanoscale Electro-Photonic Tweezer for Terahertz Monitoring..:

, In: 2022 47th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz),
Lee, Geon ; Yu, Eui-Sang ; Ryu, Yong-Sang. - p. 1-2 , 2022
Link: https://doi.org/10.1109/..
 
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15

Investigation on Influences of Electricmagnetic Fields and ..:

, In: 2022 9th International Conference on Condition Monitoring and Diagnosis (CMD),
Kim, Donguk ; Kim, Minah ; Lee, Seungyeop.. - p. 687-690 , 2022
Link: https://doi.org/10.23919..
 
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