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Lee, Shinyoung
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1

Detection Strategies for Foodborne Salmonella and Prospects..:

, In: Food and Feed Safety Systems and Analysis,
Park, Si Hong ; Aydin, Mushin ; Fan, Peixin... - p. 289-308 , 2018
Link: https://doi.org/10.1016/..
 
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2

List of Contributors:

, In: Food and Feed Safety Systems and Analysis,
Ahn, Soohyoun ; Assisi, Clara ; Atungulu, Griffiths G.... - p. xv-xvi , 2018
Link: https://doi.org/10.1016/..
 
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3

Comprehensive Study of SER in FDSOI-Planar: 28 nm to 18 nm ..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Uemura, Taiki ; Chung, Byungjin ; Choi, Jaehee... - p. 1-5 , 2024
Link: https://doi.org/10.1109/..
 
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4

A Systematic Study of HCI Improvement in FinFET with Source..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Ranjan, Rakesh ; Perepa, Pavitra R. ; Lee, Ki-Don... - p. 5A.1-1-5A.1-6 , 2024
Link: https://doi.org/10.1109/..
 
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5

Soft-Error Sensitivity in SRAM Manufactured by Bulk Gate-Al..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Uemura, Taiki ; Chung, Byungjin ; Choi, Jaehee... - p. 1-6 , 2024
Link: https://doi.org/10.1109/..
 
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6

GAN-Enhanced Vertical Federated Learning System for WHAR wi..:

, In: NOMS 2024-2024 IEEE Network Operations and Management Symposium,
Lee, Chanmin ; Cho, Shinyoung ; Park, Hyungbin.. - p. 1-5 , 2024
Link: https://doi.org/10.1109/..
 
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7

Impacts of Post-Cu CMP Queue Time on Reliability:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Zhao, Yinghong ; Park, Hokyung ; Lee, Ki-Don... - p. 1-5 , 2024
Link: https://doi.org/10.1109/..
 
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8

Polarity Dependency of MOL-TDDB in FinFET:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Sharma, Manisha ; Park, Hokyung ; Zhao, Yinghong... - p. 1-3 , 2023
Link: https://doi.org/10.1109/..
 
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9

A 4nm 1.15TB/s HBM3 Interface with Resistor-Tuned Offset-Ca..:

, In: 2023 IEEE International Solid- State Circuits Conference (ISSCC),
Chae, Kwanyeob ; Park, Jiyeon ; Song, Jaegeun... - p. 1-3 , 2023
Link: https://doi.org/10.1109/..
 
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10

Impact of Barrier Metal Thickness on SRAM Reliability:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Ranjan, Rakesh ; Perepa, Pavitra Ramadevi ; Lee, Ki-Don... - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
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11

Impact of Design and Process on Alpha-Induced SER in 4 nm B..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Uemura, Taiki ; Chung, Byungjin ; Chung, Shinyoung... - p. 1-8 , 2023
Link: https://doi.org/10.1109/..
 
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12

Interaction Design of Asthma Inhaler Assistant Device:

, In: Proceedings of Sixth International Congress on Information and Communication Technology; Lecture Notes in Networks and Systems,
Park, Shinyoung ; Choi, Suhyun ; Cha, Yumi... - p. 717-729 , 2021
Link: https://doi.org/10.1007/..
 
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13

Investigation on Synaptic Characteristics of Interfacial Ph..:

, In: 2020 International SoC Design Conference (ISOCC),
Kang, Shinyoung ; Lee, Juyoung ; Song, Yunheub - p. 169-170 , 2020
Link: https://doi.org/10.1109/..
 
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14

Signal Integrity Analysis of Automotive CAN-FD Networks wit..:

, In: 2020 IEEE Electrical Design of Advanced Packaging and Systems (EDAPS),
Park, Shinyoung ; Lee, Seongsoo ; Sim, Boogyo... - p. 1-3 , 2020
Link: https://doi.org/10.1109/..
 
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15

22.5 An 8nm 18Gb/s/pin GDDR6 PHY with TX Bandwidth Extensio..:

, In: 2020 IEEE International Solid- State Circuits Conference - (ISSCC),
Lee, Soo-Min ; Seong, Kihwan ; Shin, Joohee... - p. 338-340 , 2020
Link: https://doi.org/10.1109/..
 
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