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Lelis, Aivars J.
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1

Towards a Robust Approach to Threshold Voltage Characteriza..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Habersat, Daniel B. ; Lelis, Aivars J. ; Green, Ronald - p. 1-4 , 2020
Link: https://doi.org/10.1109/..
 
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2

Characterization of the origin of band states in the SiC/Si..:

, In: 2007 International Semiconductor Device Research Symposium,
Biggerstaff, Trinity L. ; McClellan, Ryan D. ; Lelis, Aivars... - p. None , 2007
Link: https://doi.org/10.1109/..
 
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3

Status of 1200V 4H-SiC Power DMOSFETs:

, In: 2007 International Semiconductor Device Research Symposium,
Hull, Brett A. ; Husna, Fatima ; Agarwal, Anant... - p. None , 2007
Link: https://doi.org/10.1109/..
 
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