Lesnikov, V.
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1

Analysis of Ge:Mn Magnetic Semiconductor Layers by XPS and ..:

, In: Springer Proceedings in Physics; Microscopy of Semiconducting Materials 2007,
Danilov, Yu A ; Demidov, E S ; Zubkov, S Yu... - p. 123-126 ,
 
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Topography of the z-Plane Discretized by Quantizing the Coe..:

, In: Advances in Signal Processing; Intelligent Systems Reference Library,
 
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Countering Cybercrime as the Main Area of State Criminal Po..:

, In: Technological Trends in the AI Economy; Smart Innovation, Systems and Technologies,
 
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