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2024 IEEE International Symposium on Hardware Oriented Security and Trust (HOST) ,
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Photon Emission Modeling and Machine-Learning Assisted Pre-..:
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2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA) ,
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Dynamic IR-Drop Prediction of At-Speed Two-Vector Tests Usi..:
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2023 IEEE International Test Conference (ITC) ,
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High-Speed, Low-Storage Power and Thermal Predictions for A..:
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2022 23rd International Symposium on Quality Electronic Design (ISQED) ,
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Low-IR-Drop Test Pattern Regeneration Using A Fast Predicto:
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2022 27th Asia and South Pacific Design Automation Conference (ASP-DAC) ,
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Vector-based Dynamic IR-drop Prediction Using Machine Learn..:
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Proceedings of the 23rd Asia and South Pacific Design Automation Conference ,
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Machine learning based generic violation waiver system with..:
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2019 IEEE 4th International Future Energy Electronics Conference (IFEEC) ,
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Research on Symmetrical LLC Converter Applied to DC Transfo..:
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2023 Asia-Pacific Microwave Conference (APMC) ,
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Dual-Polarized Patch Array Antennas with Wide Beamwidth for..:
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2023 IEEE International Magnetic Conference - Short Papers (INTERMAG Short Papers) ,
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Application of Oleic acid functionalized Fe3O4 magnetic nan..:
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2023 IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia (WiPDA Asia) ,
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Demonstration of High Voltage GaN-on-Si p-GaN gate HEMTs (>..:
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2022 IEEE International Conference on Consumer Electronics - Taiwan ,
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Design and Implementation of an Access Control System by Us..:
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2022 IEEE International Test Conference (ITC) ,
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Wafer Defect Pattern Classification with Explainable-Decisi..:
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2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) ,
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Wafer-Level Test Path Pattern Recognition and Test Characte..:
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2020 IEEE International Test Conference (ITC) ,
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TestDNA-E: Wafer Defect Signature for Pattern Recognition b..:
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2020 IEEE 9th Global Conference on Consumer Electronics (GCCE) ,
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