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2022 IEEE International Conference on Communications Workshops (ICC Workshops) ,
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Derivative-Free Placement Optimization for Multi-UAV Wirele..:
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2022 41st Chinese Control Conference (CCC) ,
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Fixed-Time Fault-Tolerant Sliding Mode Control for Robot Ma..:
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ACM Turing Award Celebration Conference - China ( ACM TURC 2021) ,
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BSLKT: A Bagging Model with Self-Attention and LightGBM for..:
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2020 12th International Conference on Advanced Computational Intelligence (ICACI) ,
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Event-Triggered Control for Networked Systems with Time-Del..:
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2020 16th International Conference on Control, Automation, Robotics and Vision (ICARCV) ,
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Event-Triggered Remote Dynamic Control for Network Control ..:
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Communications in Computer and Information Science; Artificial Intelligence and Security ,
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MM-Stega: Multi-modal Steganography Based on Text-Image Mat..:
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The 2023 ACM International Conference on Supporting Group Work (GROUP '23) Companion ,
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VR-Explorer: A Demonstration of a Virtual Reality Interacti..:
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2024 IEEE 6th Advanced Information Management, Communicates, Electronic and Automation Control Conference (IMCEC) ,
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Analysis of the causes of power anomalies caused by faults ..:
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Human iPSC-derived Disease Models for Drug Discovery; Handbook of Experimental Pharmacology ,
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iPSC-Derived Corneal Endothelial Cells:
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2023 IEEE 6th International Conference on Automation, Electronics and Electrical Engineering (AUTEEE) ,
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Research on Underground Cable Facility System Based on Iot ..:
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2023 International Conference on Microwave and Millimeter Wave Technology (ICMMT) ,
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Design of a Low-pass Filter Based on the Through-Silicon-Vi..:
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2023 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP) ,
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A Novel Liquid-Filling Based Beam-Steering Technology for a..:
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2023 International Conference on Microwave and Millimeter Wave Technology (ICMMT) ,
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A Low Sidelobe Wideband Slotted Antenna Array Fed by High-O..:
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2023 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE) ,
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Defect Modeling During the SLM Process for Manufacturing Mi..:
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Proceedings of the 25th International ACM SIGACCESS Conference on Computers and Accessibility ,
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