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Liao, Li-Yi
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1

Characterization of Low Loss Dielectric Materials for High-..:

, In: 2022 IEEE 72nd Electronic Components and Technology Conference (ECTC),
Lee, Tzu Nien ; Lau, John H ; Ko, Cheng-Ta... - p. 2222-2229 , 2022
Link: https://doi.org/10.1109/..
 
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2

NTIRE 2020 Challenge on NonHomogeneous Dehazing:

, In: 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW),
Ancuti, Codruta O. ; Ancuti, Cosmin ; Vasluianu, Florin-Alexandru... - p. 2029-2044 , 2020
Link: https://doi.org/10.1109/..
 
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3

Fast and accurate emissivity and absolute temperature maps ..:

, In: Proceedings of the 2014 IEEE/ACM International Conference on Computer-Aided Design,
Yu, Hsueh-Ling ; Li, Yih-Lang ; Liao, Tzu-Yi... - p. 542-549 , 2014
Link: https://dl.acm.org/doi/1..
 
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4

Real-time 3D Target Inference via Biomechanical Simulation:

, In: Proceedings of the CHI Conference on Human Factors in Computing Systems,
Moon, Hee-Seung ; Liao, Yi-Chi ; Li, Chenyu.. - p. 1-18 , 2024
Link: https://dl.acm.org/doi/1..
 
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5

A Novel Millimeter-wave Reflector Antenna with Sum-differen..:

, In: 2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT),
Zhou, Di ; Zhang, Li ; Ji, Xiao-Li. - p. 1-3 , 2022
Link: https://doi.org/10.1109/..
 
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6

Wafer Defect Pattern Classification with Explainable-Decisi..:

, In: 2022 IEEE International Test Conference (ITC),
Cheng, Ken Chau-Cheung ; Li, Katherine Shu-Min ; Wang, Sying-Jyan... - p. 549-553 , 2022
Link: https://doi.org/10.1109/..
 
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7

Integrated Scratch Marker for Wafer Defect Diagnosis:

, In: 2021 IEEE International Test Conference in Asia (ITC-Asia),
Li, Katherine Shu-Min ; Chen, Leon Li-Yang ; Liao, Peter Yi-Yu... - p. 1-4 , 2021
Link: https://doi.org/10.1109/..
 
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8

Wafer-level test path pattern recognition and test characte..:

, In: Proceedings of the 23rd Conference on Design, Automation and Test in Europe,
Cheng, Ken Chau-Cheung ; Li, Katherine Shu-Min ; Huang, Andrew Yi-Ann... - p. 1710-1711 , 2020
Link: https://dl.acm.org/doi/1..
 
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9

PWS: Potential Wafermap Scratch Defect Pattern Recognition ..:

, In: 2020 IEEE European Test Symposium (ETS),
Li, Katherine Shu-Min ; Liao, Peter Yi-Yu ; Chou, Leon... - p. 1-6 , 2020
Link: https://doi.org/10.1109/..
 
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10

Wafer-Level Test Path Pattern Recognition and Test Characte..:

, In: 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE),
Cheng, Ken Chau-Cheung ; Shu-Min Li, Katherine ; Huang, Andrew Yi-Ann... - p. 1710-1711 , 2020
Link: https://doi.org/10.23919..
 
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11

On the investigation of population sizing of genetic algori..:

, In: Proceedings of the Genetic and Evolutionary Computation Conference,
Liao, Yi-Yun ; Hsu, Hung-Wei ; Juang, Yi-Lin. - p. 820-828 , 2019
Link: https://dl.acm.org/doi/1..
 
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12

fStrip : a malleable shape-retaining wearable strip for ..:

, In: Adjunct Proceedings of the 2015 ACM International Joint Conference on Pervasive and Ubiquitous Computing and Proceedings of the 2015 ACM International Symposium on Wearable Computers,
Chien, Chin-yu ; Li, Cheng-Yuan ; Chan, Liwei... - p. 105-108 , 2015
Link: https://dl.acm.org/doi/1..
 
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13

Experimental Research of Pressure-Volume Diagrams in a Scro..:

, In: Springer Proceedings in Energy; 13th International Conference on Compressors and Their Systems,
Li, Xiaowen ; Guo, Qiuhe ; Hu, Yusheng... - p. 315-325 , 2024
Link: https://doi.org/10.1007/..
 
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14

Multi-Kernel Tensor Fusion on Grassmann Manifold for Genomi..:

, In: 2023 IEEE International Conference on Bioinformatics and Biomedicine (BIBM),
Qi, Fei ; Li, Junyu ; Liao, Yi... - p. 609-615 , 2023
Link: https://doi.org/10.1109/..
 
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15

Generative AI Enables the Detection of Autism Using EEG Sig..:

, In: Biometric Recognition; Lecture Notes in Computer Science,
Li, Yisheng ; Liao, Iman Yi ; Zhong, Ning... - p. 375-384 , 2023
Link: https://doi.org/10.1007/..
 
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