Liaw, Li-Jie
14  results:
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1

Impact of embedding techniques in FBG sensors:

, In: The Ninth International Conference onCommunications Systems, 2004. ICCS 2004.,
Hao, Jianzhong ; Peng, Guangxi ; Liaw, Chin-Li... - p. 559-563 , 2004
 
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2

Not by Convention: Working with People on the Sexual and Ge..:

, In: The Massachusetts General Hospital Textbook on Diversity and Cultural Sensitivity in Mental Health; Current Clinical Psychiatry,
 
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3

3.7-GHz Multi-Bank High-Current Single-Port Cache SRAM with..:

, In: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
 
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4

A 3nm 256Mb SRAM in FinFET Technology with New Array Bankin..:

, In: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Chang, Jonathan ; Chen, Yen-Huei ; Chan, Gary... - p. 1-2 , 2023
 
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5

Building IoT sensors to estimate PM2.5 concentrations:

, In: 2022 International Conference on Electrical, Computer and Energy Technologies (ICECET),
Chen, Ting-Yu ; Lo, Li-Wei ; Lin, Yan-Ting. - p. 1-5 , 2022
 
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6

REVEAL 2022: Reinforcement Learning-Based Recommender Syste..:

, In: Proceedings of the 16th ACM Conference on Recommender Systems,
Liaw, Richard ; Bailey, Paige ; Li, Ying.. - p. 684-685 , 2022
 
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7

A Research on Real-Name Blockchain System Bind Health Passb..:

, In: Lecture Notes in Electrical Engineering; Frontier Computing,
Kao, Jui-Hung ; Wu, Wei-Chen ; Hsu, Li-Min. - p. 1810-1819 , 2020
 
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8

Brillouin Optical Time Domain Analysis Integrated Fiber-Bra..:

, In: 2020 Opto-Electronics and Communications Conference (OECC),
 
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9

L band Semiconductor Optical Amplifier Integrated a Built-I..:

, In: 2020 Opto-Electronics and Communications Conference (OECC),
 
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10

Probabilities of qualitative behaviors for dependability an..:

, In: Proceedings of the 1992 ACM/SIGAPP symposium on Applied computing: technological challenges of the 1990's,
Berleant, Daniel ; Chandra, Arun ; Bognæs, Kristian... - p. 883-889 , 1992
 
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11

A 3nm CMOS FinFlex™ Platform Technology with Enhanced Power..:

, In: 2022 International Electron Devices Meeting (IEDM),
Wu, Shien-Yang ; Chang, C.H. ; Chiang, M.C.... - p. 27.5.1-27.5.4 , 2022
 
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12

Critical Process Features Enabling Aggressive Contacted Gat..:

, In: 2022 International Electron Devices Meeting (IEDM),
Chang, Chih-Hao ; Chang, V.S. ; Pan, K.H.... - p. 27.1.1-27.1.4 , 2022
 
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