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Contemporary Issues in Technology Education; Locating Technology Education in STEM Teaching and Learning ,
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STEM Projects: Outside of the Curriculum:
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2023 IEEE International Magnetic Conference - Short Papers (INTERMAG Short Papers) ,
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Study of interplay between magnetic/electric fields and Cr-..:
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Contemporary Issues in Technology Education; Standards-Based Technology and Engineering Education ,
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The Application of International Models for Standards-Based..:
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2023 9th International Conference on Applied System Innovation (ICASI) ,
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Deploying Pre-Quantized Deep Learning Models on Heterogeneo..:
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Proceedings of the Great Lakes Symposium on VLSI 2017 ,
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A Maze Routing-Based Algorithm for ML-OARST with Pre-Select..:
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Proceedings of the 24th edition of the great lakes symposium on VLSI ,
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Logic block and design methodology for via-configurable str..:
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Proceedings of the 20th symposium on Great lakes symposium on VLSI ,
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Via configurable three-input lookup-tables for structured A..:
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Proceedings of the 2010 Asia and South Pacific Design Automation Conference ,
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Speeding up SoC virtual platform simulation by data-depende..:
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Smart Nanostructure Materials and Sensor Technology ,
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Micro and Nanofibers-Based Sensing Devices:
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Innovative Mobile and Internet Services in Ubiquitous Computing; Lecture Notes on Data Engineering and Communications Technologies ,
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The Implement of a Reconfigurable Intelligence Trust Chain ..:
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2023 IEEE International Conference on e-Business Engineering (ICEBE) ,
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eVTOL, UAM, and AAM: Brief Development History and Implemen..:
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2023 IEEE 5th Eurasia Conference on IOT, Communication and Engineering (ECICE) ,
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Design and Application Research of Bionic Mechanical Finger:
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2021 International Conference on Security and Information Technologies with AI, Internet Computing and Big-data Applications; Smart Innovation, Systems and Technologies ,
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Combining a Bi-LSTM-Based Siamese Network with Word2Vec Alg..:
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2022 IEEE International Test Conference in Asia (ITC-Asia) ,
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Diagnosing Transition Delay Faults under Scan-Based Logic A..:
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Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743) ,
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