Search for persons
X
?
2023 IEEE 97th Vehicular Technology Conference (VTC2023-Spring) ,
1
Wireless Multi-Target Vital Sign Detection Using SIMO-FMCW ..:
, In:
?
2022 IEEE International Symposium on Circuits and Systems (ISCAS) ,
2
A Highly Parallel Fine-Grained Sort-Merge Join on Near Memo..:
, In:
?
2019 Joint International Symposium on Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Sapporo/APEMC) ,
3
Classification of an Embedded System Instruction EMI Using ..:
, In:
?
2019 Joint International Symposium on Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Sapporo/APEMC) ,
4
Tree Structure Network: A Learning-Based Deep Network for C..:
, In:
?
Human Aspects of IT for the Aged Population. Design for the Elderly and Technology Acceptance; Lecture Notes in Computer Science ,
5
A Study of Performance on Multi-touch Gesture for Multi-hap..:
, In:
?
2019 Electrical Design of Advanced Packaging and Systems (EDAPS) ,
6
Dielectric Characterization of Printed Circuit Board by Mic..:
, In:
?
Proceedings of the 9th ACM/IEEE International Conference on Information Processing in Sensor Networks ,
7
User-centric radio power control for opportunistic mountain..:
, In:
?
2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD) ,
8
Comprehensive Study on Trapping-Induced Dynamics in β-Ga2O3..:
, In:
?
2022 IEEE 22nd International Conference on Bioinformatics and Bioengineering (BIBE) ,
9
Association between Mitral Valve Prolapse and panic disorde..:
, In:
?
2019 IEEE Photonics Conference (IPC) ,
10
An Investigation on 25Gb/s Ultra-Short Cavity Quantum Well ..:
, In:
?
2019 IEEE International Conference on Consumer Electronics - Taiwan (ICCE-TW) ,
11
The Development and Evaluation of an Educational Board Game..:
, In:
?
2016 IEEE Silicon Nanoelectronics Workshop (SNW) ,
12
Contact resistance reduction on layered MoS2 by Ar plasma p..:
, In:
?
2008 9th International Conference on Solid-State and Integrated-Circuit Technology ,
13