Lukas Zimmermann
23  results:
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1

Hardware-Intrinsic Security with Printed Electronics for Id..:

, In: 2020 European Conference on Circuit Theory and Design (ECCTD),
 
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2

Research Aspects for Secure Communication in the Industrial..:

, In: 2020 IEEE 11th International Conference on Dependable Systems, Services and Technologies (DESSERT),
Sikora, Axel ; Walz, Andi ; Zimmermann, Lukas - p. 284-289 , 2020
 
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3

Modeling of Random Variations in a Switched Capacitor Circu..:

, In: 2020 The 8th International Conference on Information Technology: IoT and Smart City,
 
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4

Response of Alpine Vegetation to Elevated CO2:

, In: Carbon Dioxide and Terrestrial Ecosystems,
 
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5

Whom Do You Follow? : Pedestrian Flows Constraining the ..:

, In: Proceedings of the 23rd ACM International Conference on Intelligent Virtual Agents,
 
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6

A Dataset for Entity Recognition in the Automotive Warranty..:

, In: 2024 7th International Conference on Artificial Intelligence and Big Data (ICAIBD),
 
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7

Efficient Token Augmented Fine-Tuning:

, In: 2023 IEEE Asia-Pacific Conference on Computer Science and Data Engineering (CSDE),
 
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8

W&G-BERT: A Pretrained Language Model for Automotive Warran..:

, In: 2023 6th International Conference on Artificial Intelligence and Big Data (ICAIBD),
 
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9

Citizens empowerment in smart energy communities:

, In: 2022 IEEE International Smart Cities Conference (ISC2),
 
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10

Effects of Medical Clothing on Person Re-Identification Alg..:

, In: 2022 IEEE International Symposium on Medical Measurements and Applications (MeMeA),
 
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11

Using Augmented Reality and Artificial Intelligence for an ..:

, In: 2022 International Conference on Electrical, Computer, Communications and Mechatronics Engineering (ICECCME),
 
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12

Deep Learning-Based Bias Transfer for Overcoming Laboratory..:

, In: Medical Image Understanding and Analysis; Lecture Notes in Computer Science,
 
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14

TOSCA4QC: Two Modeling Styles for TOSCA to Automate the Dep..:

, In: 2020 IEEE 24th International Enterprise Distributed Object Computing Conference (EDOC),
 
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15

Reliability of Mechatronic Integrated Devices Regarding Fai..:

, In: 2020 43rd International Spring Seminar on Electronics Technology (ISSE),
 
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