Maeda, T.
98  results:
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1

Automatic determination algorithm of intrinsic parameters o..:

, In: 2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD),
Lee, C. ; Hayashi, H. ; Kobayashi, D.... - p. 1-1 , 2023
 
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Simulation study on functional images to optimize radiograp..:

, In: 2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD),
Nishigami, R. ; Hayashi, H. ; Kobayashi, D.... - p. 1-1 , 2023
 
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3

Blurring correction for calculating functional images using..:

, In: 2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD),
Kobayashi, D. ; Hayashi, H. ; Nishigami, R.... - p. 1-2 , 2023
 
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4

First Demonstration of Defect Elimination for Cryogenic Ge ..:

, In: 2023 International Electron Devices Meeting (IEDM),
Yu, X.-R. ; Hsieh, C.-C. ; Chuang, M.-H.... - p. 1-4 , 2023
 
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5

First Demonstration of Vertical Stacked Hetero-Oriented n-G..:

, In: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Yu, X.-R. ; Chang, W.-H ; Hong, T.-C.... - p. 399-400 , 2022
 
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Integration Design and Process of 3-D Heterogeneous 6T SRAM..:

, In: 2022 International Electron Devices Meeting (IEDM),
Yu, X.-R. ; Chuang, M.-H. ; Chang, S.-W.... - p. 20.5.1-20.5.4 , 2022
 
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Optimal Cell Structure/Operation Design of 3D Semicircular ..:

, In: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Morooka, T. ; Ishikawa, T. ; Komura, M.... - p. 308-309 , 2022
 
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FerroHEMTs: High-Current and High-Speed All-Epitaxial AlScN..:

, In: 2022 International Electron Devices Meeting (IEDM),
Casamento, J. ; Nomoto, K. ; Nguyen, T. S.... - p. 11.1.1-11.1.4 , 2022
 
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9

Modeling and Characterization of InAs Quantum-Well Metal-Ox..:

, In: 2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Maeda, T. ; Ishii, H. ; Chang, W. H... - p. 1-4 , 2020
 
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10

Performance and Reliability Improvement in Ge nMOSFETs with..:

, In: 2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Chang, W. H. ; Irisawa, T. ; Mizubayashi, W... - p. 1-4 , 2020
 
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11

Photon counting method for improvement of energy resolution..:

, In: 2019 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC),
Khai, B. T. ; Ajimura, S. ; Chan, W. M.... - p. 1-4 , 2019
 
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13

CO2 Mitigation by residential fuel cells and interconnectio..:

, In: Greenhouse Gas Control Technologies 7,
AKI, H ; YAMAMOTO, S ; KONDOH, J... - p. 1797-1800 , 2005
 
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14

Shaking the world : galvanic vestibular stimulation as a..:

, In: ACM SIGGRAPH 2005 Emerging technologies,
Maeda, T. ; Ando, H. ; Amemiya, T.... - p. 17-es , 2005
 
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15

Path delay test compaction with process variation tolerance:

, In: Proceedings. 42nd Design Automation Conference, 2005.,
Kajihara, S. ; Fukunaga, M. ; Xiaoqing Wen... - p. 845,846,847,848,849,850 , 2005
 
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