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Martin, D.S.
~ 3000  results:
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1

Charge-based Sense Demonstration in 1T-1C HZO FeRAM Arrays ..:

, In: 2024 IEEE International Memory Workshop (IMW),
Billoint, O. ; Martin, S. ; Laguerre, J.... - p. 1-4 , 2024
Link: https://doi.org/10.1109/..
 
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2

Data Retention Insights from Joint Analysis on BEOL-Integra..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Laguerre, J. ; Martin, S. ; Coignus, J.... - p. 1-7 , 2024
Link: https://doi.org/10.1109/..
 
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3

Fabrication of Low-Power RRAM for Stateful Hyperdimensional..:

, In: 2023 International VLSI Symposium on Technology, Systems and Applications (VLSI-TSA/VLSI-DAT),
Dubreuil, T. ; Barraud, S. ; Previtali, B.... - p. 1-2 , 2023
Link: https://doi.org/10.1109/..
 
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4

Memory Window in Si:HfO2 FeRAM arrays: Performance Improvem..:

, In: 2023 IEEE International Memory Workshop (IMW),
Laguerre, J. ; Bocquet, M. ; Billoint, O.... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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5

Human-Vehicle Interaction for Autonomous Vehicles in Crossw..:

, In: 2023 IEEE 26th International Conference on Intelligent Transportation Systems (ITSC),
Izquierdo, R. ; Martin, S. ; Alonso, J.... - p. 2473-2478 , 2023
Link: https://doi.org/10.1109/..
 
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6

Convolution neural network inference using frequency modula..:

, In: 2023 IEEE International Integrated Reliability Workshop (IIRW),
Trabelsi, A. ; Cagli, C. ; Hirtzlin, T.... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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7

Multi Level Cell Reliability in Ge-rich GeSbTe-based Phase ..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Meli, V. ; Navarro, G. ; Rottner, J.... - p. 1-5 , 2023
Link: https://doi.org/10.1109/..
 
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8

Reliability assessment of hafnia-based ferroelectric device..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Grenouillet, L. ; Barbot, J. ; Laguerre, J.... - p. 1-8 , 2023
Link: https://doi.org/10.1109/..
 
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9

Integration of HfO2-based 3D OxRAM with GAA stacked-nanoshe..:

, In: ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC),
Dubreuil, T. ; Barraud, S. ; Pedini, J.-M.... - p. 117-120 , 2023
Link: https://doi.org/10.1109/..
 
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10

Enhanced Thermal Confinement in Phase-Change Memory Targeti..:

, In: ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC),
De Camaret, C. ; Bourgeois, G. ; Cueto, O.... - p. 233-236 , 2022
Link: https://doi.org/10.1109/..
 
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11

The Role of Interface Dynamics on the Reliability Performan..:

, In: 2022 International Electron Devices Meeting (IEDM),
Alcala, R. ; Lomenzo, P.D. ; Mittmann, T.... - p. 32.8.1-32.8.4 , 2022
Link: https://doi.org/10.1109/..
 
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12

Spike-based Beamforming using pMUT Arrays for Ultra-Low Pow..:

, In: 2022 International Electron Devices Meeting (IEDM),
Hardy, E. ; Fain, B. ; Mesquida, T.... - p. 24.4.1-24.4.4 , 2022
Link: https://doi.org/10.1109/..
 
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13

Multilayer Structure in SeAsGeSi-based OTS for High Thermal..:

, In: ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC),
Laguna, C. ; Bernard, M. ; Garrione, J.... - p. 225-228 , 2022
Link: https://doi.org/10.1109/..
 
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14

16kbit 1T1R OxRAM arrays embedded in 28nm FDSOI technology ..:

, In: 2021 IEEE International Memory Workshop (IMW),
Grenouillet, L. ; Castellani, N. ; Persico, A.... - p. 1-4 , 2021
Link: https://doi.org/10.1109/..
 
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15

In depth TCAD analysis of threshold voltage on GaN-on-Si MO..:

, In: 2021 33rd International Symposium on Power Semiconductor Devices and ICs (ISPSD),
Jaud, M. -A. ; Vandendaele, W. ; Rrustemi, B.... - p. 319-322 , 2021
Link: https://doi.org/10.23919..
 
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