I agree that this site is using cookies. You can find further informations here.
X
Mathur, Nitish
3  results:
Bookchapter (Online) X
Search for persons X
?
1

Simulating degradation of TDDB lifetime due to burn-in usin..:

, In: 2007 International Workshop on Physics of Semiconductor Devices,
ManjulaRani, K. N. ; Samanta, S. K. ; Mathur, Nitish. - p. None , 2007
Link: https://doi.org/10.1109/..
 
?
2

Contributors:

, In: New and Future Developments in Microbial Biotechnology and Bioengineering,
Acharya, Krishnendu ; Agrawal, Komal ; Anand, Garima... - p. ix-x , 2021
Link: https://doi.org/10.1016/..
 
?
3

List of contributors:

, In: Wastewater Treatment Reactors,
Agrawal, Komal ; Anand, Vandita ; Awasthi, Shruti... - p. xvii-xxiv , 2021
Link: https://doi.org/10.1016/..
 
1-3