Mertens, R. Tyler
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1

An 8-bit Flash Analog-to-Digital Converter in standard CMOS..:

, In: ESSCIRC 2008 - 34th European Solid-State Circuits Conference,
Creten, Y. ; Merken, P. ; Mertens, R... - p. None , 2008
 
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2

On Szebehely's Inverse Problem for a Particle Describing Or..:

, In: Zeitschrift für Angewandte Mathematik und Mechanik Volume 65, Number 8,
Bozis, G. ; Mertens, R. - p. 383-385 , 1985
 
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3

On the Exact Theory of Tops Rising by Friction:

, In: Zeitschrift für Angewandte Mathematik und Mechanik Band 62, Heft 4,
 
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Polycrystalline Silicon in ULSI:

, In: Encyclopedia of Materials: Science and Technology,
Ghannam, M.Y. ; Mertens, R.P. - p. 7152-7158 , 2001
 
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5

Transformation of Temperature Timeseries into Features that..:

, In: 2018 IEEE 31st International Symposium on Computer-Based Medical Systems (CBMS),
Ravindran, Rohith ; Niemann, Uli ; Klose, Silke... - p. 65-70 , 2018
 
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Chapter 9 Diet and Nutrition of Central Yellowstone Elk Dur..:

, In: The Ecology of Large Mammals in Central Yellowstone - Sixteen Years of Integrated Field Studies; Terrestrial Ecology,
 
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Antiinfektive Therapie:

, In: Die Infektiologie,
D., Adam ; W., Christ ; D., Hofmann... - p. 75-207 , 2004
 
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9

The Instable Scar:

, In: Recurrent Hernia,
Rosch, R. ; Binnebösel, M. ; Junge, K.... - p. 59-62 ,
 
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12

Justice and Intragroup Cooperation:

, In: The Oxford handbook of prosocial behavior / edited by David A. Schroeder and William G. Graziano
Tyler, Tom R.. (2013) 
 
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13

CMOS Scaling by Nanosheet Device Architectures and Backside..:

, In: 2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA),
Horiguchi, N. ; Mertens, H. ; Ritzenthaler, R.... - p. 1-2 , 2024
 
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14

Towards Improved Nanosheet-Based Complementary Field Effect..:

, In: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Chiarella, T. ; Matagne, P. ; Mertens, H.... - p. 1-3 , 2024
 
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15

Reliability challenges in Forksheet Devices: (Invited Paper:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Bury, E. ; Vandemaele, M. ; Franco, J.... - p. 1-8 , 2023
 
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