Miura, H.
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1

Contributors:

, In: Handbook of Metal Injection Molding,
Ahn, S. ; Atre, S.V. ; Banerjee, S.... - p. xiii-xiv , 2019
 
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2

Measurement of the strength of a grain boundary by using th..:

, In: Recent Advances in Structural Integrity Analysis - Proceedings of the International Congress (APCF/SIF-2014),
Nakanishi, T. ; Suzuki, K. ; Miura, H. - p. 560-564 , 2014
 
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3

Stress-induced anisotropic diffusion of component elements ..:

, In: Recent Advances in Structural Integrity Analysis - Proceedings of the International Congress (APCF/SIF-2014),
Suzuki, K. ; Ochi, M. ; Miura, H. - p. 524-528 , 2014
 
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4

Metal injection molding (MIM) of soft magnetic materials:

, In: Handbook of Metal Injection Molding,
Miura, H. - p. 487-515 , 2012
 
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5

Metal injection molding (MIM) of soft magnetic materials:

, In: Handbook of Metal Injection Molding,
Miura, H. - p. 499-524 , 2012
 
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6

Contributor contact details:

, In: Handbook of Metal Injection Molding,
Heaney, Donald F. ; German, R.M. ; Atre, S.V.... - p. xiii-xvi , 2012
 
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7

A CMOS-CCD signal processor for skew compensation:

, In: 1987 IEEE International Solid-State Circuits Conference. Digest of Technical Papers,
Miura, H. ; Masuda, I. ; Sato, M. - p. 112,113 , 1987
 
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8

Practical Development of Accident Tolerant Fecral-Ods Fuel ..:

, In: Springer Proceedings in Physics; Proceedings of the 2023 Water Reactor Fuel Performance Meeting,
Sakamoto, K. ; Sakaguchi, C. ; Miura, Y.... - p. 20-28 , 2023
 
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9

Hadronic contributions to the anomalous magnetic moment of ..:

, In: High Performance Computing in Science and Engineering '21,
Cè, M. ; Chao, E.-H. ; Gérardin, A.... - p. 19-33 , 2023
 
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10

25 nm iPMA-type Hexa-MTJ with solder reflow capability and ..:

, In: 2022 International Electron Devices Meeting (IEDM),
Honjo, H. ; Nishioka, K. ; Miura, S.... - p. 10.3.1-10.3.4 , 2022
 
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11

Hadronic Contributions to the Anomalous Magnetic Moment of ..:

, In: High Performance Computing in Science and Engineering '20,
Cè, M. ; Gérardin, A. ; von Hippel, G.... - p. 5-19 , 2021
 
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12

Gate Oxide Instability against a Wide Range of Negative Ele..:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
Noguchi, M. ; Koyama, A. ; Iwamatsu, T... - p. 36.3.1-36.3.4 , 2021
 
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13

1.2 kV GaN/SiC-based Hybrid High Electron Mobility Transist..:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
Nakajima, A. ; Hirai, H. ; Miura, Y.. - p. 36.5.1-36.5.4 , 2021
 
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14

Scalability of Quad Interface p-MTJ for 1X nm STT-MRAM with..:

, In: 2020 IEEE Symposium on VLSI Technology,
Miura, S. ; Nishioka, K. ; Naganuma, H.... - p. 1-2 , 2020
 
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15

Innovative Test Practices in Asia:

, In: 2020 IEEE 38th VLSI Test Symposium (VTS),
Iwasaki, Takeshi ; Aso, Masao ; Futami, Haruji... - p. 1-1 , 2020
 
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