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Miyake, Masao
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On-Chip Delay Measurement for Degradation Detection And Its..:

, In: 2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS),
Miyake, Yousuke ; Kato, Takaaki ; Kajihara, Seiji... - p. 1-6 , 2020
Link: https://doi.org/10.1109/..
 
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Innovative Test Practices in Asia:

, In: 2020 IEEE 38th VLSI Test Symposium (VTS),
Iwasaki, Takeshi ; Aso, Masao ; Futami, Haruji... - p. 1-1 , 2020
Link: https://doi.org/10.1109/..
 
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